Leads: Sultan Lilani and Rick Marshall
Today’s counterfeiters have started to introduce very sophisticated counterfeit parts within the EEE domain such that these parts cannot be readily verified to be authentic or not. The counterfeiters are using such advanced technics as cloning and are using processes that do not leave any physical traces on the device to be able to be detected using such conventional techniques as Testing, X-Ray, External Visual, XRF, Decap amongst others. Proactive planning, part monitoring, and resolution implementation are all necessary to mitigate the risks and impacts of counterfeit parts and materials from entering the DoD Supply Chain and possibly prevent the introduction of counterfeit product into product used by DoD. This track will discuss best practices and lessons learned in these areas. Presentations are sought from individuals who are Counterfeit Prevention and Detection subject matter experts.
Possible topics include, but are not limited to the following:
Abstract Submission | Aug 31 |
Abstract Notification | late Dec |
Final Presentation Submitted | Feb 28 |